Imaging
Transmission Electron Microscope - JEOL 1230 TEM
Scanning Electron Microscope - Zeiss Sigma 300 FESEM
Sample Preparation for Routine TEM Analysis:
- Routine processing including fixation, dehydration, infiltration, and embedding.
- Thick & Thin Sectioning including heavy metal staining of resulting grids.
- Negative Staining.
Sample Preparation for Routine SEM Analysis:
- Routine Processing of biological samples requiering fixation, dehydration, and critical point drying.
- Sputter coating of stubs with gold/palladium.
TEM and SEM Analysis
- Independent use of microscopes is generally encourged as both instruments are very user-friendly.
- Training can be provided, according to level of techincal competence.
- Analysis of samples by an experienced technologist is available, if needed.
Ancillary Equipment:
- Leica EM CPD300 critical point dryer.
- Leica EM ACE600 sputter coater.
- Reichert/Leica Ultracut E ultramicrotome.
Specialiazed services not deemed "routine" can also be provided, depending on the nature of techniques, time-lines, and costs involved.